Atomic Force Microscope and Scanning Probe Microscope

Angstrom Advanced Inc. offers a wide variety of Atomic Force Microscopes (AFM), Scanning Probe Microscope(SPM) and Scanning Electron Micrscope(SEM) to suit your research needs. Angstrom Advanced Inc.'s AFM, SPM, SEM are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have made the Angstrom Advanced Inc.'s AFM, SPM, SEM to lead in the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle. Angstrom Advanced AFM scientists and technical support staffs provide premier service world wide to assist in much needed research.

  • AA2000 Atomic Force Microscope (AFM)

    Combined Atomic Force Microscope(AFM) and Lateral Force Microscope(LFM)

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  • AA3000 Scanning Probe Microscope(SPM)

    Combined Scanning Probe Microscope(SPM), Atomic Force microscope(AFM) and Lateral ForceMicroscope(LFM)

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  • AA5000 Multi-function Scanning Probe Microscope(SPM) Systems

    Full range of STM, AFM, LFM, Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing

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  • AA6000 mini Desktop Scanning Electron Microscope(SEM)

    Angstrom-mini SEM is a true desktop multi-purpose, multi-user Scanning Electron Microscope.

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  • AA7000 SEM Scanning Electron Microscope

    It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment.

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  • AA8000 Multi-function Scanning Electron System(SEM)

    AA8000 combines high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment.
     

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