Angstrom Advanced Inc. offers a wide variety of Atomic Force Microscopes (AFM) and Scanning Probe Microscope(SPM) to suit your research needs. Angstrom Advanced Inc.'s AFMs and SPMs are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have made the Angstrom Advanced Inc.'s AFMs and SPMs to lead in the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle. Angstrom Advanced AFM & SPM scientists and technical support staffs provide premier service world wide to assist in much needed research.

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  AA2000 Atomic Force Microscope (AFM)

  Combined Atomic Force Microscope(AFM) and Lateral Force Microscope(LFM)

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  AA3000 Scanning Probe Microscope(SPM)

  Combined Scanning Probe Microscope(SPM), Atomic Force microscope(AFM) and Lateral ForceMicroscope(LFM)

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  AA5000 Multi-function Scanning Probe Microscope(SPM) Systems

  Full range of STM, AFM, LFM, Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing

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  OS-AA Opening Multi-function Scanning Probe Microscope(SPM)

  Full range of STM, AFM, LFM, MFM, EFM
  Full openness for further developments
  

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