Products
  • AA2000 Atomic Force Microscope (AFM)

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  • AA3000 Scanning Probe Microscope(SPM)

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  • AA5000 Multi-function Scanning Probe Microscope(SPM) Systems

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  • AA6000 mini Desktop Scanning Electron Microscope(SEM)

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  • AA7000 SEM Scanning Electron Microscope

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  • AA8000 Multi-function Scanning Electron System(SEM)

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  • OS-AA Opening Multi-function Scanning Probe Microscope(SPM)

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Atomic Force Microscope and Scanning Probe Microscope

AA3000 Scanning Probe Microscope

Inquiry and Sales: sales@angstrom-advanced.com or Online Request

Introduction

AA3000 Scanning Probe Microscope is a very popular model. This unit is tailored towards research and industry applications, where the user can perform rapid and simple analysis. The detector is built directly into the base, eliminating the chance of damaging it through handling. AA3000 Scanning Probe Microscope is capable of performing contact mode, tapping mode, lateral force microscopy and scanning tunneling microscopy. The standard unit is equipped to view sample areas up to 10 micron by 10 micron. The system can be customized to measure larger areas. With a Digital Signal Processor (DSP) TMS320C642 inside the systems, AA3000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA3000 SPM system.

Features

High Performance

  • Atomic-scale of resolution
  • Large sample size
  • DSP(Digital Signal Processing) for great performance
  • Real time operating system embedded
  • Fast Ethernet connection with computer

Multi-Function

  • Atomic Force Microscope (AFM)
  • Lateral Force Microscope (LFM)
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve
  • Online real-time 3D image for better observation
  • Multi-channel signals for more sample details
  • Trace-Retrace scan, Back-Forward scan
  • Multi-Analysis: Granularity and Roughness
  • Data load-out for further analysis

Easy Operation

  • Fast automatically tip-engaging
  • Easy change of the tip holder, for simple switching between STM and AFM
  • Full digital control, auto system status recognition
  • Software-based sample movement
  • Nano-Movie function: Continuous data collection, storage and replay
  • Modularized design for convenient maintenance and future upgrades
Specifications
Functions Atomic Force Microscope (AFM)
Scanning Tunneling Microscope(STM)
Lateral Force Microscope (LFM)
Resolution AFM: 0.26nm lateral, 0.1nm vertical
Scanning Tunneling Microscope(STM)
Technical Parameters X-Y scan scope: ~ 10 micrometer
Z distance: ~ 2 micrometer
Image Pixels: 128 × 128, 256 × 256, 512 × 512, 1024 × 1024
Scan Angle: 0 ~ 360°
Scan Rate: 0.1 ~ 100Hz
Electronics CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments
Fast16-bit DAC
Fast16-bit ADC
High Voltage: 5 channel
Communication Interface: 10M/100M Fast Ethernet
Mechanics Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000,and reach 30mm when use the AA5000;
Engagement: Auto engagement with travel distance of 30mm and precision of 50nm
Software Online Control Software and offline Image Processing Software