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Atomic Force Microscope and Scanning Probe Microscope

AA6000 mini Desktop Scanning Electron Microscope

Inquiry and Sales: sales@angstrom-advanced.com or Online Request

Introduction

Angstrom AA6000 mini SEM is a true desktop multi-purpose, multi-user Scanning Electron Microscope. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment, and perfect balance between stable configuration and excellent resolution.

Specifications
Resolution 5nm @ 30kV, SE
Acceleration Voltage 0.6 ~ 20 KeV (Max. 30KeV)
Magnification 10X ~ 150,000 MAX. (Additional Digital Zoom 2X/4X/8X) (Option: 10X ~ 200,000X)
Visual Inpection Source Electron induced Display (Tungsten Hair Pin Type)
Probe Current 1pA ~ Max. ~ 8uA
Bean Control Beam Shift : 250um, Beam Rotation: 360°
SE Detector High Sensitivity SE detector
Image Signal Mode Area (320 × 240),Inspection (640 × 480) Photo Mode (1280 × 960 ~ 5120 × 3840) (Option: max. 8192 × 6144 with upgrade mode)
5 Axis Stage Movement Stroke X/Y/Z/ = 40/40/40 mm, Rotation = 360° Option: Tilt: 0 ~ 90° Option: Stage Motorization
Vacuum system Full Automation (or Manual Mode) Rotary Pump & Turbo Pump Convection Gauge(Pirani + Penning Gauge)
Control Rack PC Environmental Operation Operating system : Windows Serial communication: control data interface
Display System 22” LCD monitor
Port Ports for EDS, BSE, Etc. Port Sufficient for all detector & Up-gradation
GUI& Tools BSE Mode Converter Switch(BSE, EDS, ETC.) Pixel averaging scan/ Photo Scan/ etc. Measurement (Angle, Area, Horizontal. Vertical, Width, Cross, Box) Simple Measuring function by using Horizontal Line, Vertical Line, Diagonal Lines, Boxes, Angle, Area, etc. Annotation (Symbol Such Circle, Boxes, Line, Arrowed, Line), Image Shift & Image Rotation(Raster Rotation) Image Compression / Compression Type : BMP, JPEG, Data Including Magnification, Working Distance, KV & Mark Bar. Thumbnail Image Display
Image Processor Length/Min.dia/Max dia/Circularity/Eccentricity/Excel Data/Graph Data export to Excel file with original Image Free Line Measurement, Grain analysis Various User Define Filters Image Tiling AOI(Area Of Interest) Particle Counter (Blob Analysis)
Automatic Control Auto Brightness/ Contrast Multi Focus & Dynamic Focus Auto Focus/ Auto stigmator/ etc. Auto Emission Beam Current Raster Rotation (Mouse Adjustment) Cathode Using Time ( Life Time)) Mouse Control(Dragging or Scroll Methodology)