• AA2000 Atomic Force Microscope (AFM)

  • AA3000 Scanning Probe Microscope(SPM)

  • AA5000 Multi-function Scanning Probe Microscope(SPM) Systems

  • AA5000 Multi-function Scanning Probe Microscope(SPM) Systems

Atomic Force Microscope and Scanning Probe Microscope

AA2000 Atomic Force Microscope

Inquiry and Sales: or Online Request


High Performance

  • Atomic-scale of resolution
  • Large sample size
  • DSP(Digital Signal Processing) for great performance
  • Real time operating system embedded
  • Fast Ethernet connection with computer


  • Atomic Force Microscope (AFM)
  • Lateral Force Microscope (LFM)
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve
  • Online real-time 3D image for better observation
  • Multi-channel signals for more sample details
  • Trace-Retrace scan, Back-Forward scan
  • Multi-Analysis: Granularity and Roughness
  • Data load-out for further analysis

Easy Operation

  • Fast automatically tip-engaging
  • Easy change of the tip holder, for simple switching between STM and AFM
  • Full digital control, auto system status recognition
  • Software-based sample movement
  • Nano-Movie function: Continuous data collection, storage and replay
  • Modularized design for convenient maintenance and future upgrades
Functions Atomic Force Microscope (AFM)
Lateral Force Microscope (LFM)
Resolution AFM: 0.26nm lateral, 0.1nm vertical
Technical Parameters X-Y scan scope: ~ 10 micrometer
Z distance: ~ 2 micrometer
Image Pixels: 128 × 128, 256 × 256, 512 × 512, 1024 × 1024
Scan Angle: 0 ~ 360°
Scan Rate: 0.1 ~ 100 Hz
Electronics CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments
Fast16-bit DAC
Fast16-bit ADC
High Voltage: 5 channel
Communication Interface: 10M/100M Fast Ethernet
Mechanics Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000, and reach 30mm when use the AA5000;
Engagement: Auto engagement with travel distance of 30mm and precision of 50nm
Software Online Control Software and offline Image Processing Software