• AA2000 Atomic Force Microscope (AFM)

  • AA3000 Scanning Probe Microscope(SPM)

  • AA5000 Multi-function Scanning Probe Microscope(SPM) Systems

  • OS-AA Opening Multi-function Scanning Probe Microscope(SPM)

Atomic Force Microscope and Scanning Probe Microscope

AA5000 Multi-function SPM Systems

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AA5000 multi-function Scanning Probe Microscope is Angstrom Advanced's most innovated AFM/SPM model. AA5000 features a full coverage of AFM/SPM features-STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing... AA5000 is designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor (DSP) TMS320C642 inside the system, AA5000 can handle complicated multi-functional tasks efficiently. A real time operating system of SPM/DNA is embedded in AA5000 SPM system.

  • Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM;
  • Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode;
  • SPM can be in liquid;
  • Real-time temperature and humidity detecting;
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve;
  • Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode;
  • Fast automatically tip-engaging
  • Simply change of the tip holder to switch between STM and AFM;
  • Full digital control, auto system status recognition;
  • Adjustable lightening inside
  • With a 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved;
  • Controller and Computer connected through a 10M/100M Fast Ethernet;
  • Large sample size: up to diameter 45mm, 30mm thick;
  • Online Control Software and offline Image Processing Software for Windows;
  • Trace-Retrace scan, Back-Forward scan;
  • Online real-time 3D image;
  • Automatically Brightness and Contrast refresh;
  • Data can be loaded out for further analysis;
  • Nano-Movie function: Continuous data collection, storage and replay;
  • Multi-Analysis: Granularity and Roughness;
  • Tip Estimation and Image Re-construction;
  • Modularized design for convenience of maintenance and future upgrade;
  • Second display monitor and optical microscope system attachable;
Functions Atomic Force Microscope (AFM) which has full coverage of Contacting Mode,
Tapping Mode, Phase Imaging and Lifting Mode;
Lateral Force Microscope (LFM);
Scanning Tunneling Microscope (STM);
Conductive AFM, SPM in liquid, Environmental Control SPM;
Nano-Processing System including Lithography Mode and Vector Scan Mode;
Resolution AFM: 0.26nm lateral, 0.1nm vertical;
STM: 0.13nm lateral, 0.01nm vertical;
Technical Parameter Current Sensitivity: less than or equal to 10pA;
Force Sensitivity:less than or equal to 5pN;
Image Pixels: 128 × 128, 256 × 256, 512 × 512, 1024 × 1024, 2048 × 2048;
Scan Angle: 0 ~ 360° adjustable;
Scan Rate: 0.1 ~ 100 Hz adjustable;
Pre-setting Tunneling Current: 0.001 ~ 10nA Bias: -10 ~ +10 V;
Temperature Sensitivity: 0.1 Celsius, Humidity Sensitivity: 0.5% RH;  
Sample Size: Up to 50mm × 50mm, and 30mm thick;
Engagement: Auto engagement with travel distance of 30mm and precision of 50nm;
Online Control Software and offline Image Processing Software for Windows
Electronics CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments;
DAC: 20 channels of 16-bit DAC;
ADC: 20 channels of 16-bit ADC;
Communication Interface: 10M/100M Fast Ethernet;