Atomic Force Microscope and Scanning Probe Microscope

Angstrom Advanced Inc. offers a wide variety of Atomic Force Microscopes (AFM), Scanning Probe Microscope(SPM) and Scanning Electron Micrscope(SEM) to suit your research needs. Angstrom Advanced Inc.'s AFM, SPM, SEM are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have made the Angstrom Advanced Inc.'s AFM, SPM, SEM to lead in the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle. Angstrom Advanced AFM scientists and technical support staffs provide premier service world wide to assist in much needed research.

  • OS-AA Opening Multi-function Scanning Probe Microscope(SPM)

    Full range of STM, AFM, LFM, MFM, EFM
    Full openness for further developments


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