Angstrom Advanced AA8000 is a true multi-purpose, multi-user Scanning Electron Microscope(SEM). It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material research environment. The AA8000 Scanning Electron Microscope features a perfect balance between stable configuration and an excellent resolution. The AA8000 Scanning Electron Microscope has state-of-art SEM technology. Its rock-solid reliability and fully automated control functions provide customer with the maximum analytical capability. Angstrom AA8000 SEM pursues compact SEM design which is great for office environment. Angstrom AA8000 SEM provides high scan speed and pixel resolution and high performance control driver with new PCI board. A full set of automated image adjustment functions make it easy for new users to quickly acquire crisp, noise-free images. Even experienced users will benefit from the automated contrast, brightness and focus.

High Performance

• Field proven image quality
• Upgraded scan speed and pixel resolution.
• Wide variety of optional instrument
• Resolution : 3.0 nm
• Magnification : ~ 1,000,000X
• Display : Photo 4096 × 4096
• Search : 640 × 480 30fps
• Options : BSE / WDS / EDS / EBSD / Etc.

Gun Coumn

• Gun design for stable current supply
• Dual field objective lens for spherical
• Aberration reduction
• Movable aperture for beam centering
• Upgraded design of magnetic lens (CL/OL)

Chamber & Stage

• 5 axis eucentric stage
• Option: Stage motorization
• EDS,WDS,CCD, Manipulator etc
• 50 × 60 × 57mm

Detector

• ET-bar type SE detector
• SE & BSE double image mode
• Option: BSE detector

GUI

• Window based GUI
• PC controlled operation
• Image thumbnail & storage
• Parameter Display

Vacuum System

• Automatic & Manual control
• Automatic Safety System
• R.P+D.P/ R.P+TMP

Image Analyzer

• Data transfer to Excel
• Particle counter for blob analysis
• Multi-focusing & Tiling
• 3D data view etc

Z ELECTRON OPTIC SYSTEM	Resolution	3.0 nm @30KeV SE/ 4.0nm @BSE
	Magnification	10 ~ 1,000,000X
	Image	Color Optical Microscope Image (Option)
	Beam Scan Mode	Search, Inspection, Photo (3step)
	Accelerating Voltage	0.5 ~ 30kV
	Electron Gun Type	Tungsten Filament
	Bias System	Linked with Acc. Voltage plus continuous voltage control
	Gun Alignment	Pre-centered cartridge
	Condenser Lens	Electromagnetic 2 stages
	Objective Lens	Electromagnetic 1 stages
	Stigmator	8 Pole Electromagnetic Type
	Detector	Bar Type SE Detector (SE-BSE Conversion Mode Without BSE detector for Non-coating sample inspection)
	Image Shift	4 Pole Electromagnetic Type
	Automation Function	Auto-Focus, Auto-Stigmatism, Auto Contrast/Brightness, Emission Current etc.

DISPLAY	Frame Memory &Scan	Search (640X480) >30 frame/s
		Inspection (1280X960)  30 frame/s
		Photo(4096X4096)  2 frame/s

IMAGE ANALYZER	Image Analyzer Particle Counter	Multi-Focusing/ Image Tiling/ 3D-View/Enhancement/ Color Transformation/Filters/ Blob Analysis (Single/Multiple/Grouping), Histogram, Excel Data, Point Measurement

STAGE SYSTEM	Movement (X/Y/Z) mm	60/70/65mm
	Tilt	-20 ~ 60° (Max 90°)
	Rotation	360°
	Stage Motorization	X,Y,R (Standard) X,Y,Z,Tilt,Rotation (Option)

VACUUM SYSTEM	Vacuum Control Type	Full automation with safety system
	Vacuum System	Rotary Pump + Diffusion Pump or Rotary Pump + Turbo Pump (Option)

CONTROL SYSTEM	Computer System	Intel Pentium 4(Dual Co-Processor)
	Memory	≥ 256MB, Control Data Interface
	Operation System	Image Acquisition