OS-AA Scanning Probe Microscopy system has multi-functionality and full openness. OS-AA Scanning Probe Microscope is not just a platform for unconventional experiments but also for further developments.

• Milti-function: STM, AFM, LFM, MFM, EFM, Contacting Mode, Tapping, Phase
• Imaging with Full digital control 16bit ADC/DAC
• High speed communication based on TCP/IP protocol for double-CPU-double-OS and
• large data-exchange
• Input/output signal channel preserved for further system extension
• Standard external open interface for second developments
• I-V Curve and Force-Curve
• Nano-Processing
• Nano-manipulating with Super-Multimedia technology
• Designed for Windows Vista/XP/NT/2000/9X
• Hardcode and Dynamic Code both applied to offline software
• Brightness and contrast auto refreshed Multi-Analysis: Granularity and Roughness

• Resolution: AFM: 0.26nm lateral, 0.1nm vertical;STM: 0.13nm lateral, 0.01nm vertical
• Current Sensitivity: ≤10pA
• Force Sensitivity: ≤ 1nN
• Positioning Accuracy: ≤ 0.5nm
• Output channels preserved: 6ch (1ch ± 10V, 16-bit DAC)
• Input channels preserved: 16ch (100k/16-bit ADC with Low-pass filter and amplifier)
• DI/DO channels preserved: 8ch DI, 8ch DO