Products
  • AA2000 Atomic Force Microscope (AFM)

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  • AA3000 Scanning Probe Microscope(SPM)

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  • AA5000 Multi-function Scanning Probe Microscope(SPM) Systems

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  • AA6000 mini Desktop Scanning Electron Microscope(SEM)

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  • AA7000 SEM Scanning Electron Microscope

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  • AA8000 Multi-function Scanning Electron System(SEM)

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  • OS-AA Opening Multi-function Scanning Probe Microscope(SPM)

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Atomic Force Microscope and Scanning Probe Microscope

OS-AA Opening Multifunction Scanning Probe Microscope

Inquiry and Sales: sales@angstrom-advanced.com or Online Request

Introduction

OS-AA Scanning Probe Microscopy system has multi-functionality and full openness. OS-AA Scanning Probe Microscope is not just a platform for unconventional experiments but also for further developments.

Features
  • Milti-function: STM, AFM, LFM, MFM, EFM, Contacting Mode, Tapping, Phase
  • Imaging with Full digital control 16bit ADC/DAC
  • High speed communication based on TCP/IP protocol for double-CPU-double-OS and
  • large data-exchange
  • Input/output signal channel preserved for further system extension
  • Standard external open interface for second developments
  • I-V Curve and Force-Curve
  • Nano-Processing
  • Nano-manipulating with Super-Multimedia technology
  • Designed for Windows Vista/XP/NT/2000/9X
  • Hardcode and Dynamic Code both applied to offline software
  • Brightness and contrast auto refreshed Multi-Analysis: Granularity and Roughness
Specifications
  • Resolution: AFM: 0.26nm lateral, 0.1nm vertical;STM: 0.13nm lateral, 0.01nm vertical
  • Current Sensitivity: ≤10pA
  • Force Sensitivity: ≤ 1nN
  • Positioning Accuracy: ≤ 0.5nm
  • Output channels preserved: 6ch (1ch ± 10V, 16-bit DAC)
  • Input channels preserved: 16ch (100k/16-bit ADC with Low-pass filter and amplifier)
  • DI/DO channels preserved: 8ch DI, 8ch DO