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X-ray Diffractometer and X-ray Flaw Detector

ADX-8000 Mini θ - θ Powder X-ray Diffraction Instrument

Inquiry and Sales: sales@angstrom-advanced.com or Online Request

Introduction

ADX-8000 mini θ-θ Powder X-ray Diffraction(XRD) is a multi-function X-ray diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX8000 XRD has been uniquely designed for the challenges of modern materials research, where the lifetime of a X Ray diffractometer is considerably longer than the horizon of any research project. Components are top of the line and provide for a powerful system. The ADX8000 Desktop XRD has capability for powders, liquid, thin film, nanomaterials and many other different materials. The ADX8000 X-ray Diffraction can be used for many different applications - Academic, Pharmaceuticals, Chemical & Petrochemical, Materials Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc..

Features
  • Atomic-scale of resolution
  • Large sample size
  • DSP(Digital Signal Processing) for great performance
  • Real time operating system embedded
  • Fast Ethernet connection with computer
Software

General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, lattice parameter, volumes and atomic position, phase analysis, crystallographic strain, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of X-ray Diffraction(XRD) pattern et al.

  • Qualitative Analysis

    The data processing software of the Portable XRD has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.

  • Quantitative Analysis

    After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion). Phase identification, structure & microstructure analysis, thin film analysis, stress investigation, texture analysis are all available. PDF-2, PDF-4 Series Data base, ICDD, Search & Match, Crystallographic Search & Match

  • Plot and Export

    The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.

Specifications
X-ray Generator Control mode 1kV/step, 1mA/step controlled by PC
Rated output power 600W, 1200W
Tube voltage 40 kV continuously adjustable
Tube current 13 ~ 30mA continuously adjustable
X-ray tube Cu (2.4KW) Focus dimension: 1x10 mm2 LFF Ceramic or Glass
Stability ≤ 0.001%
Goniometer Goniometer θ - θ
Diffraction circle semi-diameter 150mm
Scan range of θ -3° ~ 150°
Continuous scanning speed 0.0012° ~ 70°/min
Setting speed of angle 1500°/min
Scan mode θ-θ linkage, 2θ, 2θ continuous or step scanning
One way repeatability of θ ≤ 0.0001°
Minimal stepping angle 0.0001°
precision of θd or θs ≤ 0.0001°
Filter Ni
Slits ≤ Divergence slit, Scattering slit, receiving slit
Record Unit Counter Proportional Counter
Maximal CPS 5×105 CPS , 5×107 CPS
Proportion counter energy spectrum resolution ≤ 25%(Cu, Ka)
Detectable high voltage 1500-2100V continuous tune
System detector stability ≤ 0.03%
High voltage of  the counter  differential or integral, automatic PHA, dead time emendation
System detector stability ≤ 0.03%
Sample Stage Z Adjustable
Integrated performance Dispersion dosage ≤ 1μSv/h
Integrated stability of the system ≤ 0.1%
Micro Structure Micro Structure analysis, +/-0.5nm
Micro Diffraction Micro sample or area, 2nm ~ 19um
Dimension 24 X 16 X 26 Inches