Knowledge base: Atomic Force Microscope/Scanning Probe Microscope

Angstrom Advanced Inc. offers a wide variety of Atomic Force Microscopes (AFM's) to suit your research needs. Angstrom Advanced Inc. instruments are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have lead to the Angstrom Advanced Inc. AFMs leading the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle. Angstrom Advanced AFM scientists and technical support staff provide premier service world wide to assist in much needed research.

Tapping Mode

In Tapping Mode, a cantilever is oscillating in free air at its resonant frequency. A piezo stack excites the cantilever’s substrate vertically, causing the tip to bounce up and down. As the cantilever bounces vertically, the reflected laser beam is deflected in a regular pattern over a photodiode array, generating a sinusoidal electronic signal. And this signal is converted to a root mean square (RMS) amplitude value.

When the same cantilever is oscillating at the sample surface, Although the piezo stack continues to excite the cantilever’s substrate with the same energy, the tip is deflected in its encounter with the surface. The reflected laser beam reveals information about the vertical height of the sample surface.