Knowledge base: Atomic Force Microscope/Scanning Probe Microscope

Angstrom Advanced Inc. offers a wide variety of Atomic Force Microscopes (AFM's) to suit your research needs. Angstrom Advanced Inc. instruments are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have lead to the Angstrom Advanced Inc. AFMs leading the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle. Angstrom Advanced AFM scientists and technical support staff provide premier service world wide to assist in much needed research.

Phase Mode


The difference between the actual phase of the oscillating cantilever and the phase of the drive signal can also be detected in Tapping Mode, which is named Phase Mode as shown below:

Phase Mode reveals some characteristics of the sample material itself. These material characteristics may include elasticity ("hardness"), magnetic and/or electric forces present.