July 9, 2010 Braintree, MA - Angstrom Advanced Inc., Angstrom Advanced recieved the awards of Best of Boston and Best of Braintree for optical Instruments and Apparatus for the second year in a row. This is a big landmark for Angstrom Advanced Inc. history because it shows the community and the world around us the determination to manufacture great products on the market.

Atomic Force Microscope/Scanning Probe Microscope include AFM, SPM, STM, LFM, EFM. All of the products bring and state the art techniques to meet the most advanced applications.

Combined Scanning Force Microscope(SFM), Atomic Force microscope(AFM) and Lateral Force Microscope (LFM)

Full range of STM, AFM, LFM, Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing

Full range of STM, AFM, LFM, MFM, EFM Full openness for further developments

Push button operation, compact, economical and stable. With innovation of capabilities, you can perform sulfur and carbon analysis quickly and easily

The state-of-art infrared detective technology and gas path systems. The highest accurate and precision and widest analysis range for both of carbon and sulfur from metal, no-metal and many other different materials.

The state-of-art infrared detective technology and gas path systems. The highest accurate and precision and widest analysis range for both of carbon and sulfur from metal, no-metal and many other different materials.