Knowledge base: Atomic Force Microscope/Scanning Probe Microscope

Angstrom Advanced Inc. offers a wide variety of Atomic Force Microscopes (AFM's) to suit your research needs. Angstrom Advanced Inc. instruments are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have lead to the Angstrom Advanced Inc. AFMs leading the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle. Angstrom Advanced AFM scientists and technical support staff provide premier service world wide to assist in much needed research.

Contact Mode


The feedback system controls the scanner’s Z voltage to maintain the tip-sample force constant, which leads the Up-Down signal equals to the Setpoint. The Z voltage is recorded for calculating the sample topography.

Figure 1: No force between tip and sample, no cantilever deflection.
Figure 2: Repulsion between tip and sample, cantilever deflects upside.
Figure 3: Repulsion between tip and sample, cantilever deflects upside:
X: Deflection of cantilever
k: Force constant of cantilever
F=kx