Knowledge base: Atomic Force Microscope/Scanning Probe Microscope

Angstrom Advanced Inc. offers a wide variety of Atomic Force Microscopes (AFM's) to suit your research needs. Angstrom Advanced Inc. instruments are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have lead to the Angstrom Advanced Inc. AFMs leading the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle. Angstrom Advanced AFM scientists and technical support staff provide premier service world wide to assist in much needed research.

Atomic Force Microscope and Scanning Force Microscope Software



The Software is available with the following data types of images
AFM Contact Mode:
Topography — the rise and fall of the sample surface.
Deflection — cantilever flexes because of the rise and fall of sample topography and the amount of this deflection can
be reflected by the Photodectetor’s Up-Down signal.
Friction — lateral forces between tip and sample, which causes the torsion of the cantilever and can be reflected by the Photodectetor’s Left-Right signal.

AFM Tapping Mode:
Topography — he rise and fall of the sample surface.
Amplitude — antilever oscillating amplitude changes because of the rise and fall of sample topography.
Phase — cantilever oscillating phase changes because of the sample material characteristics.

Scanning Tunneling Microscope:
Topography —the rise and fall of the sample surface.
Current — Tunneling current changes between tip and sample surface.