Knowledge base: Atomic Force Microscope/Scanning Probe Microscope

Angstrom Advanced Inc. offers a wide variety of Atomic Force Microscopes (AFM's) to suit your research needs. Angstrom Advanced Inc. instruments are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have lead to the Angstrom Advanced Inc. AFMs leading the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle. Angstrom Advanced AFM scientists and technical support staff provide premier service world wide to assist in much needed research.

Atomic Force Microscope and Scanning Force Microscope ProbeS

Different kinds of probes can be used in an Atomic Force Microscope. Proper probe selection depends on sample characteristics and system conditions.

Metal Probes
Probe used in STM must be conductive and a atomic-sharp tip is required. STM tips can be obtain by simply cut (for Pt-Ir) and electronically eroded (for tungsten).

Cantilever Probes
A flexible cantilever with an atomic-sharp tip is widely used in AFM as below.

Most cantilever probes are made by Si or SiN with different types of coatings and different shape and size.
Different samples and system conditions required different cantilevers.

Contact Mode: Theoretically all kinds of cantilever probes can be used in contact mode. But because of the different Force constant parameters, harder cantilever will cause the sample damages with the same amount of deflection.

Tapping Mode: A oscillating cantilever is required in Tapping mode. So theoretically using cantilevers with higher resonance frequency will give better resolution. Cantilevers with larger force constant and higher resonance frequency (normally over 200kHz) should be chosen.