Knowledge base: Atomic Force Microscope/Scanning Probe Microscope

Angstrom Advanced Inc. offers a wide variety of Atomic Force Microscopes (AFM's) to suit your research needs. Angstrom Advanced Inc. instruments are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have lead to the Angstrom Advanced Inc. AFMs leading the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle. Angstrom Advanced AFM scientists and technical support staff provide premier service world wide to assist in much needed research.

Atomic Force Microscope and Scanning Force Microscope Controller


The SPM Controller handles all SPM electronics such as signal processing and feedback programming.
The Controller inputs commands from a control computer via 60 pin cable and outputs the control signals that are needed for operating an AFM stage. Additional signals from the stage are relayed through the SPM Controller via the Network cable to the control computer.
At the rear of the Controller, in addition to the Network cable connection, there are two input/output ribbon cables. A 60-pin cable is used to send and receive signals from the microscope stage. A second 50-pin cable is used for accessing all of SPM Controllers signals for testing or experimentation.