Knowledge base: Atomic Force Microscope/Scanning Probe Microscope

Angstrom Advanced Inc. offers a wide variety of Atomic Force Microscopes (AFM's) to suit your research needs. Angstrom Advanced Inc. instruments are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have lead to the Angstrom Advanced Inc. AFMs leading the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle. Angstrom Advanced AFM scientists and technical support staff provide premier service world wide to assist in much needed research.

Base of Atomic Force Microscope and Scanning Force Microscope


The base of Atomic Force Microscope holds the detector,AFM Head.It also has environmental control attachment along with other optional attachments such as Vibration Isolation System.

AFM