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AA2000 Atomic Force Microscope
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Features |
High Performance
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Atomic-scale of resolution
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Large sample size
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With a DSP inside for great performance
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Real time operating system embedded
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Fast Ethernet connection with computer
Multi-Function
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Atomic Force Microscope (AFM)
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Lateral Force Microscope (LFM)
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Force Analysis: I-V Curve, I-Z Curve, Force Curve
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Online real-time 3D image for better observation
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Multi-channel signals for more sample details
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Trace-Retrace scan, Back-Forward scan
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Multi-Analysis: Granularity and Roughness
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Data load-out for further analysis
Easy Operation
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Fast automatically tip-engaging
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Simple change the tip holder to switch between STM and AFM
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Full digital control, auto system status recognition
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Software-based sample movement
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Nano-Movie function: Continuous data collection, storage and replay
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Modularized design for convenience of maintenance and future upgrade
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Specifications |
| Functions |
Atomic Force Microscope (AFM)
Lateral Force Microscope (LFM) |
| Resolution |
AFM: 0.26nm lateral, 0.1nm vertical |
| Technical Parameters |
X-Y scan scope:~10 micrometer
Z distance:~2 micrometer
Image Pixels:128X128, 256X256, 512X512, 1024X1024
Scan Angle:0~360 degree
Scan Rate: 0.1~100Hz |
| Electronics |
CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments;
Fast16-bit DAC
Fast16-bit ADC
High Voltage: 5 channel
Communication Interface: 10M/100M Fast Ethernet |
| Mechanics |
Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000,and reach 30mm when use the AA5000;
Engagement: Auto engagement with travel distance of 30mm and precision of 50nm |
| Softwares |
Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x |
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