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| ADX-2500 X-ray Diffraction Instrument |
| Introduction |
ADX-2500 X-ray Diffraction Instrument is exactly designed for application in the microstructure measurement, testing and in-depth research investigations. The different accessories and the corresponding control and calculating software could be selected to compose a diffraction system according to the practical requirements.
ADX-2500 X-ray Diffraction Instrument provides the structure analysis of single crystal, polycrystalline and amorphous sample. including phase qualitative analysis and quantitative analysis (RIR, Internal standard calibration, External standard calibration, Additive criterion), pattern indexing, unit cell determination and refinement, crystallite size and strain determination, profile fitting and structure refinement, residual stress determination, texture analysis(ODF expresses three-dimensional pole figure), crystallinity estimate from peak areas, thin film analysis. |
| Features |
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Perfect incorporation of the hardware and software system, for the needs of researchers from various fields;
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High precision of the diffraction angle measurement system to obtain the more accuracy of the data;
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Higher stability of the X-ray generator controlling system provides excellent repeatable measurement accuracy;
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Programmed operate and incorporated design, convenient for operation and the apparentness looks handsome.
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| Software |
General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, pattern smoothing and magnifying, mulriple plot, three-dimensional plot and simulation of XRD pattern et al.
- Profile fitting and overlapped peeks separation
With the help of Pseudo-Voigt or Pearson-VII function, the overlapped peeks could be separated to determine the parameters of the peaks and calculate the crystallinity, crystallite size and strain et al.
- Qualitative Analysis
The data processing software has the search and match function on the base of whole profile and diffraction angle. The whole profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.
- Quantitative Analysis
After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion).
- Plot and Export
The data processing software is operated within the Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.
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| Parts and Specifications |
| X-ray Generator |
Control mode |
1kV/step, 1mA/step controlled by PC |
| Rated output power |
3 kW |
| Tube voltage |
10-60 kV |
| Tube current |
5-80 mA |
| X-ray tube |
Cu, Fe, Co, Cr, Mo et al (2 kW)
Focus dimension: 1×10 mm2 or 0.4×10 mm2 |
| Stability |
≤ 0.01% |
| Goniometer |
Goniometer |
vertical frame |
| Diffraction circle semi-diameter |
185mm |
| Scan range of 2θ |
-15°-164° |
| Continuous scanning rate |
0.06°-76.2°/min |
| Setting speed of angle |
120°/min |
| Scan mode |
θ-2θ linkage, θ,2θ one way: continuous or step scanning |
| One way repeatability of 2θ |
≤ 0.001° |
| Minimal stepping angle |
0.001° |
| Precision of 2θ |
≤ 0.005° |
| Record Unit |
Counter |
PC or SC |
| Maximal CPS |
5×106 CPS |
| Proportion counter energy spectrum resolution |
≤ 25%(PC),
≤ 55%(SC) |
| Detectable high voltage |
1500-2100 V continuous tune |
| High voltage of the counter |
differential or integral, automatic PHA, dead time emendation |
| System detector stability |
≤ 0.01% |
| Integrated performance |
Dispersion dosage |
≤ 1μSv/h |
| Integrated stability of the system |
≤ 0.5% |
| Dimension |
1000 × 800 × 1640 mm |
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