AFM, SPM, STM, SEM, LFM, MFM, EFM, Atomic Force Microscope, Atomic Force Microscopy, Scanning Probe Microscope, Scanning Microscopy, Scanning Electron Microscope, Scanning Electron Microscopy, Lateral Force Microscope, Lateral Force Microscopy, Magnetic Force Microscope, Magnetic Force Microscopy, Electrostatic force microscopy, Electrostatic force microscope, Environmental Control SPM, Scanning Tunneling Microscope, Scanning Tunneling Microscopy


AA5000 Multi-function SPM Systems

AA5000 multi-function Scanning Probe Microscope is Angstrom Advanced's most innovated AFM/SPM model. AA5000 features a full coverage of AFM/SPM features-STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing... AA5000 is designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor (DSP) TMS320C642 inside the system, AA5000 can handle complicated multi-functional tasks efficiently. A real time operating system of SPM/DNA is embedded in AA5000 SPM system.

Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM;
Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode;
SPM can be in liquid;
Real-time temperature and humidity detecting;
Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve;
Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode;
Fast automatically tip-engaging
Simply change of the tip holder to switch between STM and AFM;
Full digital control, auto system status recognition;
Adjustable lightening inside
With a 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved;
Controller and Computer connected through a 10M/100M Fast Ethernet;
Large sample size: up to diameter 45mm, 30mm thick;
Online Control Software and offline Image Processing Software for Windows;
Trace-Retrace scan, Back-Forward scan;
Online real-time 3D image;
Automatically Brightness and Contrast refresh;
Data can be loaded out for further analysis;
Nano-Movie function: Continuous data collection, storage and replay;
Multi-Analysis: Granularity and Roughness;
Tip Estimation and Image Re-construction;
Modularized design for convenience of maintenance and future upgrade;
Second display monitor and optical microscope system attachable;



Atomic Force Microscope (AFM) which has full coverage of Contacting Mode,
Tapping Mode, Phase Imaging and Lifting Mode;
Lateral Force Microscope (LFM);
Scanning Tunneling Microscope (STM);
Conductive AFM, SPM in liquid, Environmental Control SPM;
Nano-Processing System including Lithography Mode and Vector Scan Mode;


AFM: 0.26nm lateral, 0.1nm vertical;
STM: 0.13nm lateral, 0.01nm vertical;



Current Sensitivity: less than or equal to 10pA;
Force Sensitivity:less than or equal to 5pN;
Image Pixels: 128X128, 256X256, 512X512, 1024X1024, 2048X2048;
Scan Angle: 0-360 degree adjustable;
Scan Rate: 0.1-100Hz adjustable;
Pre-setting Tunneling Current: 0.001-10nA Bias: -10-+10V;
Temperature Sensitivity: 0.1Celsius, Humidity Sensitivity: 0.5%RH;  
Sample Size: Up to 50mmx50mm, 30mm thick;
Engagement: Auto engagement with travel distance of 30mm and precision of 50nm;
Online Control Software and offline Image Processing Software for Windows


CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments;
DAC: 20 channels of 16-bit DAC;
ADC: 20 channels of 16-bit ADC;
Communication Interface: 10M/100M Fast Ethernet;