AFM, SPM, STM, SEM, LFM, MFM, EFM, Atomic Force Microscope, Atomic Force Microscopy, Scanning Probe Microscope, Scanning Microscopy, Scanning Electron Microscope, Scanning Electron Microscopy, Lateral Force Microscope, Lateral Force Microscopy, Magnetic Force Microscope, Magnetic Force Microscopy, Electrostatic force microscopy, Electrostatic force microscope, Environmental Control SPM, Scanning Tunneling Microscope, Scanning Tunneling Microscopy
Atomic Force Microscope and Scanning Probe Microscope
Angstrom Advanced Inc. offers a wide variety of Atomic Force Microscopes (AFM), Scanning Probe Microscope(SPM) and Scanning Electron Micrscope(SEM) to suit your research needs. Angstrom Advanced Inc.'s AFM, SPM, SEM are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have made the Angstrom Advanced Inc.'s AFM, SPM, SEM to lead in the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle. Angstrom Advanced AFM scientists and technical support staffs provide premier service world wide to assist in much needed research.
AA8000 combines high performance in all SEM modes & Particle
counter with ease of operation in a multi-user materials research environment
Atomic Force Microscope
AFM measures the surface of materials using a pointed tip on the end of a cantilever. A silicon or silicon nitride arm with a radius of curvature on the order of nanometers flexes due to intermolecular forces with the sample. The deflection of the cantilever is measured three different ways. It can be measured by reading the reflection of a laser from the cantilevers surface, a capacitive method or by a piezoresistive cantilever. The surface height is inputted into a feedback loop, which adjusts the height of the cantilever to avoid damaging the cantilever.
Vibration Isolation System
1) size: 460 X 400 X 1060mm
2) Frequency: <0.55Hz vertical, <0.60Hz
1) STM Tip Holder
2) AFM/LFM Tip Holder
3) Tip Holders for other developments
Non-Contact AFM oscillates the cantilever at a constant frequency with an amplitude around 10 nm. The height of the surface can be found by measuring the output of the control loop which keeps the frequency constant. Non-contact Atomic Force Microscopes scan much quicker than contact microscopes because the tip does not fatigue. Non-contact AFM is also useful for measuring flexible samples. Contact AFM can scratch and alter the surface of softer samples. The contact method can penetrate through liquids while non-contact will read surface liquids as the sample surface.
Tapping Atomic Force Microscopes have large oscillations in the tip (100 to 200 nm) which are damped by Van der Waals and dipole forces from the surface of the sample. This method is more gentle than the traditional contact method. The tapping method can also measure through liquid surfaces when used properly.
Conductive AFM Option (C-AFM)
CAFM measures both the surface topography and the conductivity of a samples. Voltage is applied to the tip and the current through the tip and sample is measured. It is used for semiconducting, low and medium conducting materials.
The tip is always in contact with the sample surface in contact AFM. The deflection of the tip is measured and held constant by a feedback loop. The stiffness of the cantilever must be low enough to prevent the tip from altering the surface of the sample.
Scanning Tunneling Microscope
Scanning Tunneling Microscopes (STM) have a tip which is actuated in the vertical direction by a piezoelectric crystal. The readings from a scanning tunneling microscope are limited by the sharpness of the tip. STM is a different method of getting very similar results to AFM. It maintains a constant distance from the sample through a feedback controller to measure the surface of the sample.