Angstrom Advanced Inc-Spectrometers, HPLC, Element Analyzers, XRD, Gas Generators.

Atomic Force Microscope and Scanning Probe Microscope

Angstrom Advanced Inc. offers a variety of atomic force microscopes (AFM's) to suit your research needs. Angstrom Advanced Inc. instruments are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have lead to the Angstrom Advanced Inc. Atomic Force Microscopes leading the industry in high-precision, low noise, low drift measurements which deliver artifact-free images in minutes. AFM technology extends beyond precise results to functionality and usability with large sample platforms saving time and hassle. Angstrom Advanced AFM scientists and technical support staff provide premier service world wide to assist in much needed research.

Products
Description
Application
Options
Modes

	AA2000 Atomic Force Microscope (AFM) Combined Atomic Force Microscope(AFM) and Lateral Force Microscope(LFM)
	AA3000 Scanning Probe Microscope(SPM) Combined Scanning Force Microscope(SPM), Atomic Force microscope(AFM) and Lateral ForceMicroscope(LFM)
	AA5000 Multi-function Scanning Probe Microscope(SPM) Systems Full range of STM, AFM, LFM, Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing
	OS-AA Opening Multi-function Scanning Probe Microscope(SPM) Full range of STM, AFM, LFM, MFM, EFM Full openness for further developments
	AIS2300 Multi-function Scanning Electron System(SEM) SEM2300 combines high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment

AFM's measures the surface of materials using a pointed tip on the end of a cantilever. A silicon or silicon nitride arm with a radius of curvature on the order of nanometers flexes due to intermolecular forces with the sample. The deflection of the cantilever is measured three different ways. It can be measured by reading the reflection of a laser from the cantilevers surface, a capacitive method or by a piezoresistive cantilever. The surface height is input into a feedback loop which adjusts the height of the cantilever to avoid damaging the cantilever.


AA2000 Atomic Force Microscope (AFM)	Applied Physics Biosensor and Bioelectronics Chemistry Nanotechnology	High-resistance film observation Amperometric and cyclic voltammetric measurements Microstructure observation Electrochemical impedance measurements
AA3000Scanning Probe Microscope(SPM)	Applied Physics Biosensor and Bioelectronics Nanotechnology	High-resistance film observation Amperometric and cyclic voltammetric measurements Microstructure observation Electrochemical impedance measurements
AA5000 Multi-function Scanning Probe Microscope(SPM) Systems	Biomaterial Electronic Communications Chemical and Materials Engineering Analytical Biochemistry	Characteristic study Surface morphology of the films Measure the conductivity electrochemical detection
OS-AAOpening Multi-function Scanning Probe Microscope(SPM)	Biomaterial Electronic Communications Chemical and Materials Engineering Analytical Biochemistry Nanotechnology	Characteristic study Surface morphology of the films Measure the conductivity electrochemical detection Electrochemical impedance measurements

Probes: Platinum-Iridium Probes for STM: Pt: 80%, Ir: 20%, Diameter: 0.25mm Tungsten Probes for STM
Calibration Standards: 1-D Standards 2-D Standards Step Height Standards Tip Characterizer Standards
Scanners
Optical Microscope System
Vibration Isolation System size: 460 X 400 X 1060mm Frequency: <0.55Hz vertical, <0.60Hz
Tip Holders STM Tip Holder AFM/LFM Tip Holder Tip Holders for other developments

Non-Contact AFM Non-Contact AFM oscillates the cantilever at a constant frequency with an amplitude around 10 nm. The height of the surface can be measured by measuring the output of the control loop which keeps the frequency constant. Non-contact Atomic Force Microscopes scan much quicker than contact microscopes because the tip does not fatigue. Non-contact AFM is also useful for measuring flexible samples. Contact AFM can scratch and alter the surface of softer samples. The contact method can penetrate through liquids while non-contact will read surface liquids as the sample surface.
Tapping Method Tapping Atomic Force Microscopes have large oscillations in the tip (100 to 200 nm) which are damped by Van der Waals and dipole forces from the surface of the sample. This method is more gentle than the traditional contact method. The tapping method can also measure through liquid surfaces when used properly.
Conductive AFM Option (C-AFM) CAFM measures both the surface topography and the conductivity of a samples. Voltage is applied to the tip and the current through the tip and sample is measured. It is used for semiconducting, low and medium conducting materials.
Contact Mode The tip is always in contact with the sample surface in contact AFM. The deflection of the tip is measured and held constant by a feedback loop. The stiffness of the cantilever must be low enough to prevent the tip from altering the surface of the sample.
Scanning Tunneling Microscope Scanning Tunneling Microscopes (STM) have a tip which is actuated in the vertical direction by a piezoelectric crystal. The readings from a scanning tunneling microscope are limited by the sharpness of the tip. STM is a different method of getting very similar results to AFM. It maintains a constant distance from the sample through a feedback controller to measure the surface of the sample.