Atomic Force Microscope and Scanning Probe Microscope

Angstrom Advanced Inc. offers a wide variety of atomic force microscopes (AFM's) to suit your research needs. Angstrom Advanced Inc. instruments are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have lead to the Angstrom Advanced Inc. AFMs leading the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle. Angstrom Advanced AFM scientists and technical support staff provide premier service world wide to assist in much needed research. 


 
  • Products
  • Description
  • Application
  • Options
  • Modes
  • Video
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AA2000 Atomic Force Microscope (AFM)

Combined Atomic Force Microscope(AFM) and Lateral Force Microscope(LFM)
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AA3000 Scanning Probe Microscope(SPM)

Combined Scanning Force Microscope(SPM), Atomic Force microscope(AFM) and Lateral ForceMicroscope(LFM)

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AA5000 Multi-function Scanning Probe Microscope(SPM) Systems

Full range of STM, AFM, LFM, Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing

 

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OS-AA Opening Multi-function Scanning Probe Microscope(SPM)

Full range of STM, AFM, LFM, MFM, EFM
Full openness for further developments

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AA8000 Multi-function Scanning Electron System(SEM)

AA8000 combines high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment

Atomic Force Microscope

AFM measures the surface of materials using a pointed tip on the end of a cantilever. A silicon or silicon nitride arm with a radius of curvature on the order of nanometers flexes due to intermolecular forces with the sample. The deflection of the cantilever is measured three different ways. It can be measured by reading the reflection of a laser from the cantilevers surface, a capacitive method or by a piezoresistive cantilever. The surface height is inputted into a feedback loop, which adjusts the height of the cantilever to avoid damaging the cantilever.

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AA2000 Atomic Force Microscope (AFM)

  • Applied Physics
  • Biosensor and Bioelectronics
  • Chemistry
  • Nanotechnology
  • High-resistance film observation
  • Amperometric and cyclic voltammetric measurements
  • Microstructure observation
  • Electrochemical impedance measurements

AA3000Scanning Probe Microscope(SPM)

  • Applied Physics
  • Biosensor and Bioelectronics
  • Nanotechnology
  • High-resistance film observation
  • Amperometric and cyclic voltammetric measurements
  • Microstructure observation
  • Electrochemical impedance measurements

AA5000 Multi-function Scanning Probe Microscope(SPM) Systems

  • Biomaterial
  • Electronic Communications
  • Chemical and Materials Engineering
  • Analytical Biochemistry
  • Characteristic study
  • Surface morphology of the films
  • Measure the conductivity
  • electrochemical detection

OS-AAOpening Multi-function Scanning Probe Microscope(SPM)

  • Biomaterial
  • Electronic Communications
  • Chemical and Materials Engineering
  • Analytical Biochemistry
  • Nanotechnology
  • Characteristic study
  • Surface morphology of the films
  • Measure the conductivity
  • electrochemical detection
  • Electrochemical impedance measurements

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Probes:
1)Platinum-Iridium Probes for STM: Pt: 80%, Ir: 20%, Diameter: 0.25mm
2)Tungsten Probes for STM

 

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Calibration Standards:
1) 1-D Standards
2) 2-D Standards
3) Step Height Standards
4) Tip Characterizer Standards

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Scanners

Optical Microscope System

Vibration Isolation System
1) size: 460 X 400 X 1060mm
2) Frequency: <0.55Hz vertical, <0.60Hz

Tip Holders
1) STM Tip Holder
2) AFM/LFM Tip Holder
3) Tip Holders for other developments

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Non-Contact AFM

Non-Contact AFM oscillates the cantilever at a constant frequency with an amplitude around 10 nm. The height of the surface can be found by measuring the output of the control loop which keeps the frequency constant. Non-contact Atomic Force Microscopes scan much quicker than contact microscopes because the tip does not fatigue. Non-contact AFM is also useful for measuring flexible samples. Contact AFM can scratch and alter the surface of softer samples. The contact method can penetrate through liquids while non-contact will read surface liquids as the sample surface.

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Tapping Method

Tapping Atomic Force Microscopes have large oscillations in the tip (100 to 200 nm) which are damped by Van der Waals and dipole forces from the surface of the sample. This method is more gentle than the traditional contact method. The tapping method can also measure through liquid surfaces when used properly.

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Conductive AFM Option (C-AFM)

CAFM measures both the surface topography and the conductivity of a samples. Voltage is applied to the tip and the current through the tip and sample is measured. It is used for semiconducting, low and medium conducting materials.

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Contact Mode

The tip is always in contact with the sample surface in contact AFM. The deflection of the tip is measured and held constant by a feedback loop. The stiffness of the cantilever must be low enough to prevent the tip from altering the surface of the sample.

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Scanning Tunneling Microscope

Scanning Tunneling Microscopes (STM) have a tip which is actuated in the vertical direction by a piezoelectric crystal. The readings from a scanning tunneling microscope are limited by the sharpness of the tip. STM is a different method of getting very similar results to AFM. It maintains a constant distance from the sample through a feedback controller to measure the surface of the sample.

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