AFM, SPM, STM, SEM, LFM, MFM, EFM, Atomic Force Microscope, Atomic Force Microscopy, Scanning Probe Microscope, Scanning Microscopy, Scanning Electron Microscope, Scanning Electron Microscopy, Lateral Force Microscope, Lateral Force Microscopy, Magnetic Force Microscope, Magnetic Force Microscopy, Electrostatic force microscopy, Electrostatic force microscope, Environmental Control SPM, Scanning Tunneling Microscope, Scanning Tunneling Microscopy

OS-AA Opening Multifunction Scanning Probe Microscope

Introductions
OS-AA Scanning Probe Microscopy system has multi-functionality and full openness. OS-AA Scanning Probe Microscope is not just a platform for unconventional experiments but also for further developments.

Features

Milti-function: STM, AFM, LFM, MFM, EFM, Contacting Mode, Tapping, Phase
Imaging with Full digital control 16bit ADC/DAC
High speed communication based on TCP/IP protocol for double-CPU-double-OS and
large data-exchange
Input/output signal channel preserved for further system extension
Standard external open interface for second developments
I-V Curve and Force-Curve
Nano-Processing
Nano-manipulating with Super-Multimedia technology
Designed for Windows Vista/XP/NT/2000/9X
Hardcode and Dynamic Code both applied to offline software
Brightness and contrast auto refreshed Multi-Analysis: Granularity and Roughness

Specifications

Resolution: AFM: 0.26nm lateral, 0.1nm vertical;STM: 0.13nm lateral, 0.01nm vertical
Current Sensitivity: ≤10pA
Force Sensitivity: ≤ 1nN
Positioning Accuracy: ≤ 0.5nm
Output channels preserved: 6ch (1ch ± 10V, 16-bit DAC)
Input channels preserved: 16ch (100k/16-bit ADC with Low-pass filter and amplifier)
DI/DO channels preserved: 8ch DI, 8ch DO