AFM, SPM, STM, SEM, LFM, MFM, EFM, Atomic Force Microscope, Atomic Force Microscopy, Scanning Probe Microscope, Scanning Microscopy, Scanning Electron Microscope, Scanning Electron Microscopy, Lateral Force Microscope, Lateral Force Microscopy, Magnetic Force Microscope, Magnetic Force Microscopy, Electrostatic force microscopy, Electrostatic force microscope, Environmental Control SPM, Scanning Tunneling Microscope, Scanning Tunneling Microscopy

 

AA3000 Scanning Probe Microscope

Introduction
AA3000 Scanning Probe Microscope is a very popular model. This unit is tailored towards research and industry applications, where the user can perform rapid and simple analysis. The detector is built directly into the base, eliminating the chance of damaging it through handling. AA3000 Scanning Probe Microscope is capable of performing contact mode, tapping mode, lateral force microscopy and scanning tunneling microscopy. The standard unit is equipped to view sample areas up to 10 micron by 10 micron. The system can be customized to measure larger areas. With a Digital Signal Processor (DSP) TMS320C642 inside the systems, AA3000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA3000 SPM system.

Features

High Performance

  • Atomic-scale of resolution
  • Large sample size
  • DSP (Digital Signal Processor)- for great performance
  • Real time operating system embedded
  • Fast Ethernet connection with computer

Multi-Function

  • Atomic Force Microscope (AFM)
  • Scanning Tunneling Microscope (STM)
  • Lateral Force Microscope (LFM)
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve
  • Online real-time 3D image for better observation
  • Multi-channel signals for more sample details
  • Trace-Retrace scan, Back-Forward scan
  • Multi-Analysis: Granularity and Roughness
  • Data load-out for further analysis

Easy Operation

  • Fast automatically tip-engaging
  • Simple change of the tip holder to switch between STM and AFM
  • Full digital control, auto system status recognition
  • Software-based sample movement
  • Nano-Movie function: Continuous data collection, storage and replay
  • Modularized design for convenient maintenance and future upgrades

 

Specifications

Functions

Atomic Force Microscope (AFM)
Scanning Tunneling Microscope(STM)
Lateral Force Microscope (LFM)

Resolution

AFM: 0.26nm lateral, 0.1nm vertical
Scanning Tunneling Microscope(STM)

Technical Parameters

X-Y scan scope:~10 micrometer
Z distance:~2 micrometer
Image Pixels:128X128, 256X256, 512X512, 1024X1024
Scan Angle:0~360 degree
Scan Rate: 0.1~100Hz

Electronics

CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments;
Fast16-bit DAC
Fast16-bit ADC
High Voltage: 5 channel
Communication Interface: 10M/100M Fast Ethernet

Mechanics

Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000,and reach 30mm when use the AA5000;
Engagement: Auto engagement with travel distance of 30mm and precision of 50nm;

Softwares Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x